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This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.

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Index of /~kurt/manuals/manuals/HP Agilent

The instrument may be stored or ship- ped in environments within the following 1 imits: Optionsand are handle or rack mount kits. Therefore, the measurements cited as examples are feasible with the A, As the measurement of a ph sample depends on the magnitude of the grounding impedance, measurement accuracy is unspecified.

To construct this terminal architecture, connection of a sample to the instrument requires the use of a test fixture or test leads in a four terminal pair configuration design. Such low dissipation factors can be measured with higher accuracy by using a low loss sample whose dissipation is known or which has an extremely a negligible low dissipation as a reference.

Figure shows the available power cords, which may be used in various countries including the standard power cord furnished with the instrument. Semiconductor Device Measurement sheet 3 of 3. General operating procedures for meas- uring an inductance, capacitance or resist- ance circuit component are outlined in Mamual This is especially useful in design or in other objectives where the data gathered should be done so under near-actual operating conditions.


A 6 measurement is possible only with a Z measurement. If desired, ph frequency may be set to a higher or lower frequency. Actual measurement error is the sum of the instru- ment error and the error peculiar to the test fixture leads used.

This is because the propagation loss in the test cables decreases the level of the test signal applied to the sample. C accuracies are same as for C-D, C-Q measurements. The measuring range for capacitance is from O.

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Additionally, a new level of ease of operation is brought to the electronics industry. Mankal setting status will again be enabled instead of standard initial control settings when the instrument is turned on. General Information sheet 2 of 2.

Accuracy readings in the graph represent the maximum error counts of the measurement read- outs manua, given measurement conditions. The A can be installed in a rack and be operated as a component of a measure- ment system. To obtain reliable measurement results, reduce the ef- fects of component lead impedance by the same methods outlined in the paragraph for High Frequency Measurement.

Thus, the four terminal pair method combines the advantages of the Figure A wide range of inductance measurements, from the inductance of a high frequency coil to that of an output transformer, can be made at suitable test frequencies. Measurement Parameter Formulas Hence, the four terminal pair method enables measurements with best accura- cy minimizing any stray capacitance and residual inductance in the test leads or test fixture.


A LCR METER [Obsolete] | Keysight (formerly Agilent’s Electronic Measurement)

The A may exhibit the following phenomena: The data is outputted in the follow- ing format: Error in ZERO offset adjustment. The program has three capabilities which are: As shown in Figurein- ductance or capacitance values for parallel and series equivalents are nearly equal when the dissipation manusl is less than 0.

When dissipation factor of a very low loss sample is measured, a negative value within allowable measurement error limits such as, for example, The typical accuracies at frequen- cies above IMHz given in the table apply when a direct attachment type test fixture is used.

Deviation is displayed as the The offset pin on the power cable is the ground wire. The letter placed between the two sections identifies country where instrument was manufactured.

Test Signal Phase on Test Cables Note Instructions for dc current bias applications are provided below dc voltage bias operating pro- cedure. Impedance of a comiponent can be expressed in vector representation by a complex number as shown in Figure General Component Measurements ‘sheet 2 of 3. The IpF full scale capacitance measurement capability is adequate for the measurement of low order capacitances of RF detector diodes, PIN diodes and so on.